Semiconductor component testers for functional and parametric control of static and dynamic parameters of semiconductor devices, which including power transistors, diodes, etc.

Features:

• Maximum voltage: 4000V
• Maximum current: 400A

Passive component testers for testing and monitoring the parameters of various passive elements. A universal system for functional and parametric control, combining a wide range of measurements, flexibility and rapid reorientation for new product types (in many cases, only adaptation of the test adapter and software is required).

Measured parameters:

• Reed switches
• Optoelectronic commutators
• Resistors
• Capacitors
• Relays