Electronic device testers for various ICs (ADC, DAC, RAM, etc.).

The testers consist of data acquisition and processing modules along with multiple probes for the testing of power parameters (voltage, current) for input and output signals.

A system for testing dynamically tuneable gyroscopes. Measurement of gyroscope parameters, including measurements in the temperature range, for products output control.

The test bench consists of a turntable, on which four gyroscopes can be installed, and a cabinet with a real-time controller, data acquisition and processing modules, as well as gyroscope control modules. The cabinet is connected to the turntable using the CAN interface.

Measured parameters:

• Supply voltage
• Current consumption
• Launch time
• Incidental deviation speed
• Parameters temperature dependence
• Parameters specific for a particular gyroscope type

Features:

• Manual and automatic measurements
• Data storage in a database
• Simultaneous testing of up to four gyroscopes
• Simple and convenient user interface
• Emergency stops