Analog chip testers for measurement of static and dynamic parameters of operational amplifiers, comparators, etc., with and heat chamber connectivity option.

Features:

• Voltage gain: from 1 to 5*10³V/mV
• Voltage offset: from ± 1µV to ± 10mV
• Input current: from ± 10nA to ± 100µA
• Common mode rejection ratio: from 20 to 130dB
• Rate of rise of output voltage: up to 5000V/µs

Digital chip testers for complex automated testing and incoming inspection of large and very large scale integration circuits and memory chips. The device can be used for testing of microprocessors, memory chips, ASICs, FPGAs, etc. The number of signal terminal connections can be varied depending on the task.

Features:

• Test memory: up to 64Mb
• Operating frequency: up to 200MHz

Mixed type IC testers for parametric control of static and dynamic parameters of analog-digital and digital-analog integrated circuits.

Features:

• Tested IC’s digit capacity: up to 24bit
• Tested IC’s with sampling rate: up to 1GHz
• Analog signal dynamic range: up to 118dBFS
• Support of TTL, LVTTL and LVDS standards